Nanometer-scale Defect Detection Using Polarized Light
Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
Author(s):Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
Format: Hardback | 316pages
Dimensions: 241.30 mm x 165.10 mm x 22.90 mm | 612.36 gr
Publication Date: 2016-08-15
ISBN 10: 1848219369
ISBN 13: 9781848219366